A list of available instruments in the EM&DC for characterization of structural, electrochemical, optical, electronic structure and charge transport properties of materials:

  • UV-VIS-NIR Spectrophotometer (Shimadzu, model UV-3600, TCC-240A thermo-electrically temperature-controlled cell holder, the specular reflectance attachment and Praying-MantisTM diffuse reflection accessory)
  • Photoluminescence Instrument (Photon Technology International (PTI), an “open architecture” design with the PTI’s QuantaMasterTM Spectrofluorometer and TimeMasterTM Lifetime Fluorometer)
  • Electron Spectroscopy for Chemical Analysis Instrument (Scienta Omicron Nanotechnology, model ESCA+S, an UHV-based, multi-technique platform for surface analysis of materials in the Ultraviolet Photoelectron Spectroscopy (UPS) configuration, He I photo-excitation, an Ar+ sputtering gun and ZalarTM for depth-profiling).
  • Εpsilon Electrochemical Workstation (BASi Instruments, model Epsilon Basic, potentiostat/galvanostats/potentiometer)
  • Time-of-Flight instrument (custom design, includes Surelite II Nd:YAG laser (Continuum Lasers) and TDS 3052 oscilloscope (Tektronix), an INSTEC HSC302 hotstage and an mK1000 temperature controller)
  • Impedance Spectrometer (Agilent 4294A)
  • Surface Profiler (KLA Tencor, model Alpha-Step IQ)

Device fabrication line includes instruments outside and inside the two-compartment MBraun glove box. 

  • Outside the glove box: Materials storage cabinet, Ultrasonic Cleaner (Branson, Model ), Oven (Fisher, Model ), UV/Ozone Cleaner (Jelight Company Inc., UVO Cleaner), Spin-coater (Specialty Coating Systems, Spincoat G3P-8), Precision Hot Plate (Electronic Microsystems LTD, model 1000-1), Laboratory Vacuum Oven (Lindberg/Blue M, model VO914SA-1);
  • Inside the glove box: Spin-coater (Specialty Coating Systems, Spincoat G3P-8), Precision Hot Plate (Electronic Microsystems LTD, model 1000-1), Two-source Thermal Evaporator (MBraun) and E-beam Evaporator (MDC vacuum products).

Instruments for characterization of photovoltaic device performance:

  • Solar Simulator 1 and I-V Station (Newport/Oriel Instruments, Model 91160, equipped with AM1.5G spectral correction filter), KG5-filtered Silicon reference cell (Newport/Oriel, Model 91150V), Source-Meter (Keithley, model 2400), measurements in glove box.
  • Solar Simulator 2 and I-V Station (SOL2A, Newport/Oriel Instruments, Model 91160, equipped with AM1.5G spectral correction filter), KG5-filtered Silicon reference cell (Newport/Oriel, Model 91150V), Source-Meter (Keithley, model 2617); measurements in air.
  • QE-PV-SI Measurement Kit (Newport/Oriel Instruments, ac and dc mode configurations); measurements in air.